Silicon oxide films with thicknesses of nm were deposited. The thickness and the refractive index of the layers were measured using an automatic.
RESULTS and DISCUSSION A. Index of Refraction and Hydrogen Content The index of refraction of the films deposited at a substrate bias of -80 V and 0.1 W.
Acteurs, Regie, Filmtitels. Väänänen, Kari . Drifting Clouds. Vaccaro, Brenda . The Mirror has two faces. Valcke, Serge Henri . De Zeemeerman.
Spielte etwas: Films index. index v
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